Putra, A.Z. , Yek, S., Kwok, S.C., Tarigan, E. and Sego, W.F. 2023. Fingerprint Identification for Attendance Using Euclidean Distance and Manhattan Distance. Sinkron : jurnal dan penelitian teknik informatika. 7, 4 (Oct. 2023), 2345-2352. DOI:https://doi.org/10.33395/sinkron.v8i4.12844.