Marlinda, L., Aziz, F. ., Widiyawati, W., & Widyasih, A. S. . (2022). Expert System Detects Laptop Damage Using Naive Bayes Method. Sinkron : Jurnal Dan Penelitian Teknik Informatika, 6(2), 515-523. https://doi.org/10.33395/sinkron.v7i2.11379