MARLINDA, L.; AZIZ, F. .; WIDIYAWATI, W.; WIDYASIH, A. S. . Expert System Detects Laptop Damage Using Naive Bayes Method. Sinkron : jurnal dan penelitian teknik informatika, [S. l.], v. 6, n. 2, p. 515-523, 2022. DOI: 10.33395/sinkron.v7i2.11379. Disponível em: https://jurnal.polgan.ac.id/index.php/sinkron/article/view/11379. Acesso em: 16 jul. 2024.