PUTRA, A. Z. .; YEK, S.; KWOK, S. C.; TARIGAN, E.; SEGO, W. F. Fingerprint Identification for Attendance Using Euclidean Distance and Manhattan Distance. Sinkron : jurnal dan penelitian teknik informatika, [S. l.], v. 7, n. 4, p. 2345-2352, 2023. DOI: 10.33395/sinkron.v8i4.12844. Disponível em: https://jurnal.polgan.ac.id/index.php/sinkron/article/view/12844. Acesso em: 27 jul. 2024.