ARFAH, D. J. .; MASRIZAL, M.; IRMAYANTI, I. Machine Learning to Predict Student Satisfaction Level Using KNN Method and Naive Bayes Method. Sinkron : jurnal dan penelitian teknik informatika, [S. l.], v. 8, n. 3, p. 1895-1908, 2024. DOI: 10.33395/sinkron.v8i3.13914. Disponível em: https://jurnal.polgan.ac.id/index.php/sinkron/article/view/13914. Acesso em: 11 aug. 2024.