Marlinda, L., Aziz, F. ., Widiyawati, W. and Widyasih, A. S. . (2022) “Expert System Detects Laptop Damage Using Naive Bayes Method”, Sinkron : jurnal dan penelitian teknik informatika, 6(2), pp. 515-523. doi: 10.33395/sinkron.v7i2.11379.