Marlinda, Linda, Faruq Aziz, Widiyawati Widiyawati, and Ajeng Sri Widyasih. “Expert System Detects Laptop Damage Using Naive Bayes Method”. Sinkron : jurnal dan penelitian teknik informatika 6, no. 2 (April 23, 2022): 515-523. Accessed July 16, 2024. https://jurnal.polgan.ac.id/index.php/sinkron/article/view/11379.